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Showing 1 to 20 of 623 results

Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
9995765 Method and apparatus of using peak force tapping mode to measure physical properties of a sampleMar 22, 16Jun 12, 18Bruker Nano, Inc.
9995764 Method and apparatus for avoiding damage when analysing a sample surface with a scanning probe microscopeMar 10, 17Jun 12, 18Carl Zeiss SMT GmbH
9995763 Precise probe placement in automated scanning probe microscopy systemsFeb 24, 15Jun 12, 18Bruker Nano, Inc.
9995766 Methods and systems for measuring a property of a macromoleculeJun 16, 10Jun 12, 18The Regents of the University of California
9989556 Systems and devices for non-destructive surface chemical analysis of samplesFeb 09, 17Jun 05, 18Horiba Instruments Incorporated
9990737 Apparatus and method for correlating images of a photolithographic maskDec 12, 14Jun 05, 18Carl Zeiss SMT GmbH
9981997 Chemical reagents for attaching affinity molecules on surfacesOct 28, 14May 29, 18Arizona Board of Regents on behalf of Arizona State University
9984941 Non-destructive, wafer scale method to evaluate defect density in heterogeneous epitaxial layersMay 31, 16May 29, 18International Business Machine Corporation
9977049 Scanning probe microscope and control method thereofApr 06, 16May 22, 18OLYMPUS CORPORATION
9977050 Wear-less operation of a material surface with a scanning probe microscopeNov 05, 10May 22, 18SWISSLITHO AG
9972547 Measurement method, manufacturing method of device, and measurement systemAug 31, 16May 15, 18TOSHIBA MEMORY CORPORATION
9966253 Forming nanotipsFeb 25, 16May 08, 18International Business Machine Corporation
9946822 Fly-height interaction simulationJul 26, 17Apr 17, 18International Business Machine Corporation
9939460 Scanning probe system with multiple probesJun 08, 17Apr 10, 18INFINITESIMA LIMITED
9939461 Head-integrated atomic force microscope and composite microscope including sameDec 23, 15Apr 10, 18Korea Research Institute of Standards and Science
9933453 Chemical nano-identification of a sample using normalized near-field spectroscopyOct 24, 17Apr 03, 18Bruker Nano, Inc.
9927461 Apparatus and algorithm for carrier profiling in scanning frequency comb microscopyMar 02, 17Mar 27, 18Not available
9921240 Probe actuation system with feedback controllerFeb 27, 15Mar 20, 18INFINITESIMA LIMITED
9921241 Scanning probe microscope and measurement range adjusting method for scanning probe microscopeMar 31, 16Mar 20, 18HITACHI HIGH-TECH SCIENCE CORPORATION
9921242 Automated atomic force microscope and the operation thereofJul 05, 16Mar 20, 18OXFORD INSTRUMENTS ASYLUM RESEARCH, INC

Showing 1 to 20 of 623 results