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Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
2020/0103,438 SCANNING PROBE HAVING MICRO-TIP, METHOD AND APPARATUS FOR MANUFACTURING THE SAMESep 25, 19Apr 02, 20NATIONAL INSTITUTE OF METROLOGY, CHINA
2020/0096,539 Numerically Controlled Rotary Probe Switching Device Based on Environment-Controllable Atomic Force MicroscopeJan 11, 19Mar 26, 20Southwest Jiaotong University
2020/0096,332 LINE EDGE ROUGHNESS ANALYSIS USING ATOMIC FORCE MICROSCOPYMar 22, 19Mar 26, 20Not available
2020/0088,762 DIAMOND PROBE HOSTING AN ATOMIC SIZED DEFECTMar 13, 18Mar 19, 20Not available
2020/0090,901 REAL-TIME DIRECT MEASUREMENT OF MECHANICAL PROPERTIES IN-SITU OF SCANNING BEAM MICROSCOPESep 12, 19Mar 19, 20Not available
2020/0081,033 METHOD FOR MOVING AND TRANSFERRING NANOWIRES USING TAPERED HAIR OF DIAMETER ON MICRON RANGENov 15, 17Mar 12, 20Not available
2020/0081,032 ATOMIC FORCE MICROSCOPE, ATOMIC FORCE MICROSCOPY, AND CONTROLLING METHOD OF AN ATOMIC FORCE MICROSCOPYNov 13, 19Mar 12, 20OLYMPUS CORPORATION
2020/0081,034 METHOD OF POSITIONING A CARRIER ON A FLAT SURFACE, AND ASSEMBLY OF A CARRIER AND A POSITIONING MEMBERNov 14, 19Mar 12, 20NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
2020/0057,028 METHOD OF AND ATOMIC FORCE MICROSCOPY SYSTEM FOR PERFORMING SUBSURFACE IMAGINGApr 04, 18Feb 20, 20Not available
2020/0049,735 FREQUENCY MODULATION DETECTION FOR PHOTO-INDUCED FORCE MICROSCOPYJan 30, 18Feb 13, 20Not available
2020/0049,733 SCANNER AND SCANNING PROBE MICROSCOPEDec 07, 17Feb 13, 20Osaka University
2020/0049,734 High Speed Atomic Force Profilometry of Large AreasAug 12, 19Feb 13, 20Not available
2020/0041,540 Scanning Probe SystemApr 06, 18Feb 06, 20Not available
2020/0041,247 INDIUM PHOSPHIDE SUBSTRATE, METHOD OF INSPECTING INDIUM PHOSPHIDE SUBSTRATE, AND METHOD OF PRODUCING INDIUM PHOSPHIDE SUBSTRATEAug 14, 19Feb 06, 20Sumitomo Electric Industries, Ltd.
2020/0041,541 Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)Aug 02, 19Feb 06, 20Not available
2020/0025,796 APPARATUS AND METHOD FOR A SCANNING PROBE MICROSCOPESep 27, 19Jan 23, 20Not available
2020/0024,649 Nanopipette Analysis of PolymersMay 01, 19Jan 23, 20Not available
2020/0011,893 SCANNING PROBE SYSTEMJul 16, 19Jan 09, 20Not available
2020/0006,033 DETECTION SYSTEMS IN SEMICONDUCTOR METROLOGY TOOLSJun 26, 19Jan 02, 20Taiwan Semiconductor Manufacturing Co., Ltd.
2020/0003,800 SCANNING PROBE MICROSCOPEFeb 22, 18Jan 02, 20Shimadzu Corporation

Showing 1 to 20 of 939 results