Impedance-matched interconnection device for connecting a vertical-pin integrated circuit probing device to integrated circuit test equipment
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United States of America Patent
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Dec 12, 2000
Grant Date -
N/A
app pub date -
Nov 5, 1998
filing date -
Nov 5, 1998
priority date (Note) -
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status (Latency Note)
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Abstract
An interconnection device used with test probe equipment for connecting a vertical-pin integrated circuit probing device to external test equipment. The interconnection device comprises a probe card with a pattern of contacts, a mounting plate adjustably mounted to the probe card and a space transformer member attached to both the mounting plate and the probe card. The space transformer carries traces which connect a small pattern of pins on the probing device with a larger pattern of conductors on the probe card. The space transformer is a laminated impedance-matching member comprising two layers of beryllium copper separated by a thin dielectric adhesive.
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