Integrated circuit test with programmable source for both AC and DC modes of operation
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United States of America Patent
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Nov 14, 1995
Grant Date -
N/A
app pub date -
Nov 1, 1993
filing date -
Nov 1, 1993
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An integrated device test system (10, 40) having AC and DC measurement modes of operation comprises a drive circuit (11, 41), a programmable measurement unit (12) and a switch (18). The drive circuit (11, 41) may be a current mode drive circuit (11) or a voltage mode drive circuit (41). The drive circuit (11, 41) is coupled to the programmable measurement unit (12) and a device under test (64). In a DC mode of operation, the switch (18) is configured to couple a sense terminal (39) with one end of an isolation resistor (66). A second end of the isolation resistor (66) is connected to a pin (63) of the device under test (64). In an AC mode of operation, the switch (18) is configured to couple the sense terminal (39) with the drive circuit (11, 41) and the force terminal (35) of the programmable measurement unit (12).
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