Olganix Corporation

Patent Owner

Watch Compare Add to Portfolio

Stats

Details

Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198
 
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 1446

Top Patents (by citation)

Upgrade to the Professional Level to View Top Patents for this Owner. Learn More

Recent Publications

  • No Recent Publications to Display

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
6671349 Tomosynthesis system and registration methodNov 13, 00Dec 30, 03[G01B]
5319550 High resolution digital image registrationJan 05, 90Jun 07, 94[G06F]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2004/0051,045 Scintillator detector and camera system and method for measuring emission uniformly and for calibration of radioactive sourcesAbandonedSep 29, 03Mar 18, 04[G01T]
5070454 Reference marker orientation system for a radiographic film-based computerized tomography systemExpiredApr 30, 90Dec 03, 91[G01N]
5051904 Computerized dynamic tomography systemExpiredMar 24, 88Sep 24, 91[G06F]

Top Inventors for This Owner

Upgrade to the Professional Level to View Top Inventors for this Owner. Learn More

We are sorry but your current selection exceeds the maximum number of comparisons () for this membership level. Upgrade to our Level for up to -1 comparisons!

We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level. Upgrade to our Level for up to -1 portfolios!.