PICK AND PLACE MACHINE WITH IMPROVED COMPONENT PICK UP INSPECTION
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United States of America Patent
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app pub date -
Oct 29, 2008
filing date -
Oct 5, 2004
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Abandoned
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Abstract
Embodiments of the present invention improve upon component level inspection performed by pick and place machines. Such improvements include inspecting the pick operation in pick and place machines by collecting images of the pick event inside the machine and identifying errors as they happen. By detecting and displaying this information as it generated on the machine, the operator or machine can take prompt and effective corrective actions.
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