Method for automatically sizing and biasing circuits by means of a database
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United States of America Patent
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Jun 6, 2006
Grant Date -
Jan 9, 2003
app pub date -
Jun 18, 2002
filing date -
Jun 28, 2001
priority date (Note) -
Expired
status (Latency Note)
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Abstract
In a method of automatically sizing and biasing a circuit, a database is provided including a plurality of records related to cells that can be utilized to form an integrated circuit. A cell parameter of a cell for a circuit is selected and compared to cell parameters residing in the records stored in the database. One record in the database is selected based upon this comparison and a performance characteristic of the circuit is determined from this record.
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