Image analysis for pick and place machines with in situ component placement inspection

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7813559
SERIAL NO

11131926

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present invention includes a method of determining a location of a component on a workpiece. A before-placement standard image is acquired of an intended placement location on a standard workpiece. Then, a standard component is placed upon the standard workpiece and the placement is verified. An after-placement standard image is acquired and a standard difference image is created from the before and after standard images. Then, a before-placement test image is acquired of an intended placement location on the workpiece. A component is then placed upon the workpiece, and after-placement test image is acquired. A test difference image is created from the before and after test images. A first offset is calculated between the before standard difference image and the before test image. Then, the test difference is transformed based on the first offset to generate a difference test image (DTR) that is registered to the standard difference image. The standard difference image is correlated to the registered difference test image (DTR) to generate a registration offset indicative of placement efficacy.

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Patent Owner(s)

Patent OwnerAddress
CYBEROPTICS CORPORATION5900 GOLDEN HILLS DRIVE GOLDEN VALLEY MN 55416

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bushman, Thomas W Marblehead, US 10 216
Case, Steven K St. Louis Park, US 61 1511
Duquette, David W Minneapolis, US 22 242
Manickam, Swaminathan Wilmington, US 10 152
Rudd, Eric P Hopkins, US 36 420
Skunes, Timothy A Mahtomedi, US 36 616

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