Method and system for modeling uncertainties in integrated circuits, systems, and fabrication processes
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United States of America Patent
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Apr 5, 2011
Grant Date -
Sep 14, 2006
app pub date -
Mar 8, 2006
filing date -
Mar 10, 2005
priority date (Note) -
Expired
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Abstract
A method and system for modeling uncertainties in integrated circuits, systems and fabrication processes may include defining interval values for each uncertain component or parameter in a circuit or system. The method may also include replacing scalar operations with interval operations in an algorithm and discontinuing interval operations in the algorithm in response to a predetermined condition. The method may also include generating a plurality of scalar samples from a plurality of intervals and determine a distribution of each uncertain component or parameter from the scalar samples of the intervals.
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