Transient pixel defect detection and correction

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United States of America Patent

PATENT NO 8660335
APP PUB NO 20110235940A1
SERIAL NO

12731062

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Abstract

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A method of processing images produced by an imaging system includes detecting transient defects by comparing the value of a selected pixel with values of a plurality of the neighboring pixels, excluding known defective pixels. The value of the selected pixel may be compared with the maximal or minimal value of the neighboring pixels, and if the comparison shows that the value of the selected pixel exceeds the maximal or minimal value by a predetermined value, then the pixel may be identified as producing transient defect. Alternatively, the value of the selected pixel may be compared with the median value of the neighboring pixels, and if the comparison shows that the value of the selected pixel deviates the median value by a predetermined value, then the pixel may be identified as producing transient defect.

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Patent Owner(s)

  • VAREX IMAGING CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Pavkovich, John Palo Alto, US 3 144

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