Electronic element comprising an electronic circuit which is to be tested and test system arrangement which is used to test the electronic element
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United States of America Patent
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Dec 29, 2009
Grant Date -
Aug 24, 2006
app pub date -
Feb 3, 2006
filing date -
Aug 5, 2003
priority date (Note) -
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Abstract
An electronic element, test system and method of testing an electronic circuit are provided. The electronic circuit has input and output terminals. The input terminals receive a test signal sequence to test the electronic circuit. Actual value signals of a 3-value logic of the electronic circuit are provided at the output terminals in response to the test signal sequence. A comparator circuit has first and second input terminals and an output terminal. Each of the output terminals of the electronic circuit are coupled to a first input terminal. The second input terminals receive desired value signals. The comparator circuit compares the actual value signals with the desired value signals and provides the comparison to the output terminal of the comparator circuit.
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