Test apparatus for testing a device under test and device for receiving a signal
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United States of America Patent
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Mar 27, 2012
Grant Date -
Nov 27, 2008
app pub date -
May 23, 2008
filing date -
May 24, 2007
priority date (Note) -
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Abstract
A test apparatus for testing a device under test includes a capture memory that stores thereon an output pattern received from the device under test, a header detecting section that reads the output pattern from the capture memory and detects a portion matching a predetermined header pattern in the output pattern, and a judging section that judges whether the output pattern is acceptable based on a result of comparison between a pattern, in the output pattern, which starts with the portion matching the predetermined header pattern and a corresponding expected value pattern.
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